A New Metric for Estimating the Disparity of Antenna Patterns in Synthetic Aperture Imaging Radiometry

Eric Anterrieu, Baptiste Palacin, Laurent Costes

Open source

DOI
10.1109/jstars.2020.3022726
Published
2020
Container
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1109/jstars.2020.3022726,
  title = {A New Metric for Estimating the Disparity of Antenna Patterns in Synthetic Aperture Imaging Radiometry},
  author = {Eric Anterrieu and Baptiste Palacin and Laurent Costes},
  year = {2020},
  journal = {IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing},
  doi = {10.1109/jstars.2020.3022726},
  url = {https://doi.org/10.1109/jstars.2020.3022726}
}

RIS

TY  - JOUR
TI  - A New Metric for Estimating the Disparity of Antenna Patterns in Synthetic Aperture Imaging Radiometry
AU  - Eric Anterrieu
AU  - Baptiste Palacin
AU  - Laurent Costes
PY  - 2020
JO  - IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
DO  - 10.1109/jstars.2020.3022726
UR  - https://doi.org/10.1109/jstars.2020.3022726
ER  - 

APA

Anterrieu, E., Palacin, B., & Costes, L. (2020). A New Metric for Estimating the Disparity of Antenna Patterns in Synthetic Aperture Imaging Radiometry. IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing. https://doi.org/10.1109/jstars.2020.3022726

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