Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems
- DOI
- 10.1109/lemcpa.2023.3240621
- Published
- 2023-03
- Container
- IEEE Letters on Electromagnetic Compatibility Practice and Applications
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/lemcpa.2023.3240621,
title = {Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems},
author = {Jaber Al Rashid and Mohsen Koohestani and Richard Perdriau and Laurent Saintis and Mihaela Barreau},
year = {2023},
journal = {IEEE Letters on Electromagnetic Compatibility Practice and Applications},
doi = {10.1109/lemcpa.2023.3240621},
url = {https://doi.org/10.1109/lemcpa.2023.3240621}
}RIS
TY - JOUR TI - Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems AU - Jaber Al Rashid AU - Mohsen Koohestani AU - Richard Perdriau AU - Laurent Saintis AU - Mihaela Barreau PY - 2023 JO - IEEE Letters on Electromagnetic Compatibility Practice and Applications DO - 10.1109/lemcpa.2023.3240621 UR - https://doi.org/10.1109/lemcpa.2023.3240621 ER -
APA
Rashid, J. A., Koohestani, M., Perdriau, R., Saintis, L., & Barreau, M. (2023). Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems. IEEE Letters on Electromagnetic Compatibility Practice and Applications. https://doi.org/10.1109/lemcpa.2023.3240621
Source records
- crossref · retrieved 2026-09-26T17:58:40.795Z