Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems

Jaber Al Rashid, Mohsen Koohestani, Richard Perdriau, Laurent Saintis, Mihaela Barreau

Open source

DOI
10.1109/lemcpa.2023.3240621
Published
2023-03
Container
IEEE Letters on Electromagnetic Compatibility Practice and Applications
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1109/lemcpa.2023.3240621,
  title = {Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems},
  author = {Jaber Al Rashid and Mohsen Koohestani and Richard Perdriau and Laurent Saintis and Mihaela Barreau},
  year = {2023},
  journal = {IEEE Letters on Electromagnetic Compatibility Practice and Applications},
  doi = {10.1109/lemcpa.2023.3240621},
  url = {https://doi.org/10.1109/lemcpa.2023.3240621}
}

RIS

TY  - JOUR
TI  - Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems
AU  - Jaber Al Rashid
AU  - Mohsen Koohestani
AU  - Richard Perdriau
AU  - Laurent Saintis
AU  - Mihaela Barreau
PY  - 2023
JO  - IEEE Letters on Electromagnetic Compatibility Practice and Applications
DO  - 10.1109/lemcpa.2023.3240621
UR  - https://doi.org/10.1109/lemcpa.2023.3240621
ER  - 

APA

Rashid, J. A., Koohestani, M., Perdriau, R., Saintis, L., & Barreau, M. (2023). Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long-Lifespan Systems. IEEE Letters on Electromagnetic Compatibility Practice and Applications. https://doi.org/10.1109/lemcpa.2023.3240621

Source records