High-Resolution Microwave Polarimetric Characterization Using an Electromagnetic Jet Lens

Mathis Granger, Bernard Bayard, Bruno Sauviac

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DOI: 10.1109/lmwt.2026.3724961
Published: 2026
Container: IEEE Microwave and Wireless Technology Letters
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1109/lmwt.2026.3724961,
  title = {High-Resolution Microwave Polarimetric Characterization Using an Electromagnetic Jet Lens},
  author = {Mathis Granger and Bernard Bayard and Bruno Sauviac},
  year = {2026},
  journal = {IEEE Microwave and Wireless Technology Letters},
  doi = {10.1109/lmwt.2026.3724961},
  url = {https://doi.org/10.1109/lmwt.2026.3724961}
}

RIS

TY  - JOUR
TI  - High-Resolution Microwave Polarimetric Characterization Using an Electromagnetic Jet Lens
AU  - Mathis Granger
AU  - Bernard Bayard
AU  - Bruno Sauviac
PY  - 2026
JO  - IEEE Microwave and Wireless Technology Letters
DO  - 10.1109/lmwt.2026.3724961
UR  - https://doi.org/10.1109/lmwt.2026.3724961
ER  -

APA

Granger, M., Bayard, B., & Sauviac, B. (2026). High-Resolution Microwave Polarimetric Characterization Using an Electromagnetic Jet Lens. IEEE Microwave and Wireless Technology Letters. https://doi.org/10.1109/lmwt.2026.3724961

Source records

crossref · retrieved 2026-09-25T21:21:50.618Z