Security challenges during VLSI test
- DOI
- 10.1109/newcas.2011.5981325
- Published
- 2011-06
- Container
- 2011 IEEE 9th International New Circuits and systems conference
- Publisher
- IEEE
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/newcas.2011.5981325,
title = {Security challenges during VLSI test},
author = {David Hely and Kurt Rosenfeld and Ramesh Karri},
year = {2011},
journal = {2011 IEEE 9th International New Circuits and systems conference},
doi = {10.1109/newcas.2011.5981325},
url = {https://doi.org/10.1109/newcas.2011.5981325}
}RIS
TY - JOUR TI - Security challenges during VLSI test AU - David Hely AU - Kurt Rosenfeld AU - Ramesh Karri PY - 2011 JO - 2011 IEEE 9th International New Circuits and systems conference DO - 10.1109/newcas.2011.5981325 UR - https://doi.org/10.1109/newcas.2011.5981325 ER -
APA
Hely, D., Rosenfeld, K., & Karri, R. (2011). Security challenges during VLSI test. 2011 IEEE 9th International New Circuits and systems conference. https://doi.org/10.1109/newcas.2011.5981325
Source records
- crossref · retrieved 2026-09-25T23:42:33.432Z