Curvilinear property measurement and computation methods for physical verification of bent waveguides in photonic integrated circuit layouts
- DOI
- 10.1109/oic.2014.6886066
- Published
- 2014-05
- Container
- 2014 Optical Interconnects Conference
- Publisher
- IEEE
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/oic.2014.6886066,
title = {Curvilinear property measurement and computation methods for physical verification of bent waveguides in photonic integrated circuit layouts},
author = {Ruping Cao and Lionel Couder and John Cayo and John Ferguson and Fedor Pikus and Alexandre Arriordaz and Ian O'Connor},
year = {2014},
journal = {2014 Optical Interconnects Conference},
doi = {10.1109/oic.2014.6886066},
url = {https://doi.org/10.1109/oic.2014.6886066}
}RIS
TY - JOUR TI - Curvilinear property measurement and computation methods for physical verification of bent waveguides in photonic integrated circuit layouts AU - Ruping Cao AU - Lionel Couder AU - John Cayo AU - John Ferguson AU - Fedor Pikus AU - Alexandre Arriordaz AU - Ian O'Connor PY - 2014 JO - 2014 Optical Interconnects Conference DO - 10.1109/oic.2014.6886066 UR - https://doi.org/10.1109/oic.2014.6886066 ER -
APA
Cao, R., Couder, L., Cayo, J., Ferguson, J., Pikus, F., Arriordaz, A., & O'Connor, I. (2014). Curvilinear property measurement and computation methods for physical verification of bent waveguides in photonic integrated circuit layouts. 2014 Optical Interconnects Conference. https://doi.org/10.1109/oic.2014.6886066
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- crossref · retrieved 2026-09-25T19:49:59.036Z