Analysis of Scalable Electromagnetically-Modeled Anomalous Reflectors Through Ray Tracing and Measurements

Le Hao, Sravan Kumar Reddy Vuyyuru, Sergei A. Tretyakov, Markus Rupp, Risto Valkonen

Open source

DOI
10.1109/ojap.2025.3597865
Published
2025-10
Container
IEEE Open Journal of Antennas and Propagation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

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BibTeX

@article{allodium:10.1109/ojap.2025.3597865,
  title = {Analysis of Scalable Electromagnetically-Modeled Anomalous Reflectors Through Ray Tracing and Measurements},
  author = {Le Hao and Sravan Kumar Reddy Vuyyuru and Sergei A. Tretyakov and Markus Rupp and Risto Valkonen},
  year = {2025},
  journal = {IEEE Open Journal of Antennas and Propagation},
  doi = {10.1109/ojap.2025.3597865},
  url = {https://doi.org/10.1109/ojap.2025.3597865}
}

RIS

TY  - JOUR
TI  - Analysis of Scalable Electromagnetically-Modeled Anomalous Reflectors Through Ray Tracing and Measurements
AU  - Le Hao
AU  - Sravan Kumar Reddy Vuyyuru
AU  - Sergei A. Tretyakov
AU  - Markus Rupp
AU  - Risto Valkonen
PY  - 2025
JO  - IEEE Open Journal of Antennas and Propagation
DO  - 10.1109/ojap.2025.3597865
UR  - https://doi.org/10.1109/ojap.2025.3597865
ER  - 

APA

Hao, L., Vuyyuru, S. K. R., Tretyakov, S. A., Rupp, M., & Valkonen, R. (2025). Analysis of Scalable Electromagnetically-Modeled Anomalous Reflectors Through Ray Tracing and Measurements. IEEE Open Journal of Antennas and Propagation. https://doi.org/10.1109/ojap.2025.3597865

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