Analysis of Scalable Electromagnetically-Modeled Anomalous Reflectors Through Ray Tracing and Measurements
- DOI
- 10.1109/ojap.2025.3597865
- Published
- 2025-10
- Container
- IEEE Open Journal of Antennas and Propagation
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/ojap.2025.3597865,
title = {Analysis of Scalable Electromagnetically-Modeled Anomalous Reflectors Through Ray Tracing and Measurements},
author = {Le Hao and Sravan Kumar Reddy Vuyyuru and Sergei A. Tretyakov and Markus Rupp and Risto Valkonen},
year = {2025},
journal = {IEEE Open Journal of Antennas and Propagation},
doi = {10.1109/ojap.2025.3597865},
url = {https://doi.org/10.1109/ojap.2025.3597865}
}RIS
TY - JOUR TI - Analysis of Scalable Electromagnetically-Modeled Anomalous Reflectors Through Ray Tracing and Measurements AU - Le Hao AU - Sravan Kumar Reddy Vuyyuru AU - Sergei A. Tretyakov AU - Markus Rupp AU - Risto Valkonen PY - 2025 JO - IEEE Open Journal of Antennas and Propagation DO - 10.1109/ojap.2025.3597865 UR - https://doi.org/10.1109/ojap.2025.3597865 ER -
APA
Hao, L., Vuyyuru, S. K. R., Tretyakov, S. A., Rupp, M., & Valkonen, R. (2025). Analysis of Scalable Electromagnetically-Modeled Anomalous Reflectors Through Ray Tracing and Measurements. IEEE Open Journal of Antennas and Propagation. https://doi.org/10.1109/ojap.2025.3597865
Source records
- crossref · retrieved 2026-09-25T23:22:22.207Z