Notice of Retraction Measurement of ESD protection structure irradiation degradation using TLP method

Qian Shi, Qing-Zhong Xiao, Yuan Liu, Yun-Fei En

Open source

DOI
10.1109/qr2mse.2013.6625980
Published
2013-07
Container
2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)
Publisher
IEEE
Open access
unknown

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BibTeX

@article{allodium:10.1109/qr2mse.2013.6625980,
  title = {Notice of Retraction Measurement of ESD protection structure irradiation degradation using TLP method},
  author = {Qian Shi and Qing-Zhong Xiao and Yuan Liu and Yun-Fei En},
  year = {2013},
  journal = {2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)},
  doi = {10.1109/qr2mse.2013.6625980},
  url = {https://doi.org/10.1109/qr2mse.2013.6625980}
}

RIS

TY  - JOUR
TI  - Notice of Retraction Measurement of ESD protection structure irradiation degradation using TLP method
AU  - Qian Shi
AU  - Qing-Zhong Xiao
AU  - Yuan Liu
AU  - Yun-Fei En
PY  - 2013
JO  - 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)
DO  - 10.1109/qr2mse.2013.6625980
UR  - https://doi.org/10.1109/qr2mse.2013.6625980
ER  - 

APA

Shi, Q., Xiao, Q., Liu, Y., & En, Y. (2013). Notice of Retraction Measurement of ESD protection structure irradiation degradation using TLP method. 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE). https://doi.org/10.1109/qr2mse.2013.6625980

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