Exploring Themes and Bias in Art using Machine Learning Image Analysis.
- DOI
- 10.1109/sieds49339.2020.9106656
- Published
- 2020 Apr
- Container
- Proceedings of the ... IEEE Systems and Information Engineering Design Symposium. IEEE Systems and Information Engineering Design Symposium
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1109/sieds49339.2020.9106656,
title = {Exploring Themes and Bias in Art using Machine Learning Image Analysis.},
author = {Surapaneni S and Syed S and Lee LY},
year = {2020},
journal = {Proceedings of the ... IEEE Systems and Information Engineering Design Symposium. IEEE Systems and Information Engineering Design Symposium},
doi = {10.1109/sieds49339.2020.9106656},
url = {https://doi.org/10.1109/sieds49339.2020.9106656}
}RIS
TY - JOUR TI - Exploring Themes and Bias in Art using Machine Learning Image Analysis. AU - Surapaneni S AU - Syed S AU - Lee LY PY - 2020 JO - Proceedings of the ... IEEE Systems and Information Engineering Design Symposium. IEEE Systems and Information Engineering Design Symposium DO - 10.1109/sieds49339.2020.9106656 UR - https://doi.org/10.1109/sieds49339.2020.9106656 ER -
APA
S, S., S, S., & LY, L. (2020). Exploring Themes and Bias in Art using Machine Learning Image Analysis.. Proceedings of the ... IEEE Systems and Information Engineering Design Symposium. IEEE Systems and Information Engineering Design Symposium. https://doi.org/10.1109/sieds49339.2020.9106656
Source records
- pubmed · retrieved 2026-09-26T22:43:17.429Z