Transition-Edge Sensor Characteristics in a Modified Bias Circuit for Multiplexed Readout
- DOI
- 10.1109/tasc.2026.3664193
- Published
- 2026-09
- Container
- IEEE Transactions on Applied Superconductivity
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/tasc.2026.3664193,
title = {Transition-Edge Sensor Characteristics in a Modified Bias Circuit for Multiplexed Readout},
author = {Stephen J. Smith and Paul van der Hulst and Nicholas A. Wakeham and Edoardo Cucchetti and W. Bertrand Doriese and Malcolm Durkin and Christian Kirsch and Joel N. Ullom and Joseph S. Adams and Simon R. Bandler and James A. Chervenak and Tannaz Farrahi and Fred M. Finkbeiner and Joshua D. Fuhrman and Samuel V. Hull and Richard L. Kelley and Caroline A. Kilbourne and Haruka Muramatsu and Frederick S. Porter and Kazuhiro Sakai and Ambarish C. Venkatasubraman and Edward J. Wassell and Michael C. Witthoeft and Sang H. Yoon},
year = {2026},
journal = {IEEE Transactions on Applied Superconductivity},
doi = {10.1109/tasc.2026.3664193},
url = {https://doi.org/10.1109/tasc.2026.3664193}
}RIS
TY - JOUR TI - Transition-Edge Sensor Characteristics in a Modified Bias Circuit for Multiplexed Readout AU - Stephen J. Smith AU - Paul van der Hulst AU - Nicholas A. Wakeham AU - Edoardo Cucchetti AU - W. Bertrand Doriese AU - Malcolm Durkin AU - Christian Kirsch AU - Joel N. Ullom AU - Joseph S. Adams AU - Simon R. Bandler AU - James A. Chervenak AU - Tannaz Farrahi AU - Fred M. Finkbeiner AU - Joshua D. Fuhrman AU - Samuel V. Hull AU - Richard L. Kelley AU - Caroline A. Kilbourne AU - Haruka Muramatsu AU - Frederick S. Porter AU - Kazuhiro Sakai AU - Ambarish C. Venkatasubraman AU - Edward J. Wassell AU - Michael C. Witthoeft AU - Sang H. Yoon PY - 2026 JO - IEEE Transactions on Applied Superconductivity DO - 10.1109/tasc.2026.3664193 UR - https://doi.org/10.1109/tasc.2026.3664193 ER -
APA
Smith, S. J., Hulst, P. V. D., Wakeham, N. A., Cucchetti, E., Doriese, W. B., Durkin, M., Kirsch, C., Ullom, J. N., Adams, J. S., Bandler, S. R., Chervenak, J. A., Farrahi, T., Finkbeiner, F. M., Fuhrman, J. D., Hull, S. V., Kelley, R. L., Kilbourne, C. A., Muramatsu, H., Porter, F. S., Sakai, K., Venkatasubraman, A. C., Wassell, E. J., Witthoeft, M. C., & Yoon, S. H. (2026). Transition-Edge Sensor Characteristics in a Modified Bias Circuit for Multiplexed Readout. IEEE Transactions on Applied Superconductivity. https://doi.org/10.1109/tasc.2026.3664193
Source records
- crossref · retrieved 2026-11-10T12:02:50.866Z