Extreme Temperature Range Microelectronics

D. Palmer, R. Heckman

Open source

DOI
10.1109/tchmt.1978.1135312
Published
1978-12
Container
IEEE Transactions on Components, Hybrids, and Manufacturing Technology
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

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Cite this work

BibTeX

@article{allodium:10.1109/tchmt.1978.1135312,
  title = {Extreme Temperature Range Microelectronics},
  author = {D. Palmer and R. Heckman},
  year = {1978},
  journal = {IEEE Transactions on Components, Hybrids, and Manufacturing Technology},
  doi = {10.1109/tchmt.1978.1135312},
  url = {https://doi.org/10.1109/tchmt.1978.1135312}
}

RIS

TY  - JOUR
TI  - Extreme Temperature Range Microelectronics
AU  - D. Palmer
AU  - R. Heckman
PY  - 1978
JO  - IEEE Transactions on Components, Hybrids, and Manufacturing Technology
DO  - 10.1109/tchmt.1978.1135312
UR  - https://doi.org/10.1109/tchmt.1978.1135312
ER  - 

APA

Palmer, D., & Heckman, R. (1978). Extreme Temperature Range Microelectronics. IEEE Transactions on Components, Hybrids, and Manufacturing Technology. https://doi.org/10.1109/tchmt.1978.1135312

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