Synthetic Stochastic Motion Platform for Testing Single Particle Tracking Microscopes

Nicholas A. Vickers, Sean B. Andersson

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DOI: 10.1109/tcst.2022.3149597
Published: 2022-11
Container: IEEE Transactions on Control Systems Technology
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1109/tcst.2022.3149597,
  title = {Synthetic Stochastic Motion Platform for Testing Single Particle Tracking Microscopes},
  author = {Nicholas A. Vickers and Sean B. Andersson},
  year = {2022},
  journal = {IEEE Transactions on Control Systems Technology},
  doi = {10.1109/tcst.2022.3149597},
  url = {https://doi.org/10.1109/tcst.2022.3149597}
}

RIS

TY  - JOUR
TI  - Synthetic Stochastic Motion Platform for Testing Single Particle Tracking Microscopes
AU  - Nicholas A. Vickers
AU  - Sean B. Andersson
PY  - 2022
JO  - IEEE Transactions on Control Systems Technology
DO  - 10.1109/tcst.2022.3149597
UR  - https://doi.org/10.1109/tcst.2022.3149597
ER  -

APA

Vickers, N. A., & Andersson, S. B. (2022). Synthetic Stochastic Motion Platform for Testing Single Particle Tracking Microscopes. IEEE Transactions on Control Systems Technology. https://doi.org/10.1109/tcst.2022.3149597

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crossref · retrieved 2026-11-10T13:54:35.831Z