Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry
- DOI
- 10.1109/ted.2019.2926684
- Published
- 2019-09
- Container
- IEEE Transactions on Electron Devices
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
Credibility signals
uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
Show all credibility signals
- supportingDOI registered: A matching record was returned by Crossref.
- supportingDOI resolves: A matching record was returned by Crossref.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredOpen access status: Not checked or no result supplied; no credibility inference made.
- not scoredPublication license: Not checked or no result supplied; no credibility inference made.
- not scoredPublication version: A publication version was supplied but is not scored.
- supportingMetadata completeness: All 6 scored descriptive metadata groups are present.
Cite this work
BibTeX
@article{allodium:10.1109/ted.2019.2926684,
title = {Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry},
author = {Mattias Kruskopf and Albert F. Rigosi and Alireza R. Panna and Dinesh K. Patel and Hanbyul Jin and Martina Marzano and Michael Berilla and David B. Newell and Randolph E. Elmquist},
year = {2019},
journal = {IEEE Transactions on Electron Devices},
doi = {10.1109/ted.2019.2926684},
url = {https://doi.org/10.1109/ted.2019.2926684}
}RIS
TY - JOUR TI - Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry AU - Mattias Kruskopf AU - Albert F. Rigosi AU - Alireza R. Panna AU - Dinesh K. Patel AU - Hanbyul Jin AU - Martina Marzano AU - Michael Berilla AU - David B. Newell AU - Randolph E. Elmquist PY - 2019 JO - IEEE Transactions on Electron Devices DO - 10.1109/ted.2019.2926684 UR - https://doi.org/10.1109/ted.2019.2926684 ER -
APA
Kruskopf, M., Rigosi, A. F., Panna, A. R., Patel, D. K., Jin, H., Marzano, M., Berilla, M., Newell, D. B., & Elmquist, R. E. (2019). Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry. IEEE Transactions on Electron Devices. https://doi.org/10.1109/ted.2019.2926684
Source records
- crossref · retrieved 2026-09-25T16:27:04.673Z