Elucidation of the Density of States for Polycrystalline Silicon Vertical Thin-Film Transistors
- DOI
- 10.1109/ted.2022.3167938
- Published
- 2022-06
- Container
- IEEE Transactions on Electron Devices
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
Credibility signals
uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
Show all credibility signals
- supportingDOI registered: A matching record was returned by Crossref.
- supportingDOI resolves: A matching record was returned by Crossref.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredOpen access status: Not checked or no result supplied; no credibility inference made.
- not scoredPublication license: Not checked or no result supplied; no credibility inference made.
- not scoredPublication version: A publication version was supplied but is not scored.
- supportingMetadata completeness: All 6 scored descriptive metadata groups are present.
Cite this work
BibTeX
@article{allodium:10.1109/ted.2022.3167938,
title = {Elucidation of the Density of States for Polycrystalline Silicon Vertical Thin-Film Transistors},
author = {Peng Zhang and Emmanuel Jacques and Regis Rogel and Laurent Pichon and Olivier Bonnaud},
year = {2022},
journal = {IEEE Transactions on Electron Devices},
doi = {10.1109/ted.2022.3167938},
url = {https://doi.org/10.1109/ted.2022.3167938}
}RIS
TY - JOUR TI - Elucidation of the Density of States for Polycrystalline Silicon Vertical Thin-Film Transistors AU - Peng Zhang AU - Emmanuel Jacques AU - Regis Rogel AU - Laurent Pichon AU - Olivier Bonnaud PY - 2022 JO - IEEE Transactions on Electron Devices DO - 10.1109/ted.2022.3167938 UR - https://doi.org/10.1109/ted.2022.3167938 ER -
APA
Zhang, P., Jacques, E., Rogel, R., Pichon, L., & Bonnaud, O. (2022). Elucidation of the Density of States for Polycrystalline Silicon Vertical Thin-Film Transistors. IEEE Transactions on Electron Devices. https://doi.org/10.1109/ted.2022.3167938
Source records
- crossref · retrieved 2026-11-10T14:39:34.351Z