Notice of Retraction: Analysis of Near-Field Shielding Effectiveness for the SiP Module

Liang Gao, Xing-Chang Wei, Yin-Tao Huang, Bin Li, Yu-Fei Shu

Open source

DOI
10.1109/temc.2017.2712719
Published
2018-02
Container
IEEE Transactions on Electromagnetic Compatibility
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

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BibTeX

@article{allodium:10.1109/temc.2017.2712719,
  title = {Notice of Retraction: Analysis of Near-Field Shielding Effectiveness for the SiP Module},
  author = {Liang Gao and Xing-Chang Wei and Yin-Tao Huang and Bin Li and Yu-Fei Shu},
  year = {2018},
  journal = {IEEE Transactions on Electromagnetic Compatibility},
  doi = {10.1109/temc.2017.2712719},
  url = {https://doi.org/10.1109/temc.2017.2712719}
}

RIS

TY  - JOUR
TI  - Notice of Retraction: Analysis of Near-Field Shielding Effectiveness for the SiP Module
AU  - Liang Gao
AU  - Xing-Chang Wei
AU  - Yin-Tao Huang
AU  - Bin Li
AU  - Yu-Fei Shu
PY  - 2018
JO  - IEEE Transactions on Electromagnetic Compatibility
DO  - 10.1109/temc.2017.2712719
UR  - https://doi.org/10.1109/temc.2017.2712719
ER  - 

APA

Gao, L., Wei, X., Huang, Y., Li, B., & Shu, Y. (2018). Notice of Retraction: Analysis of Near-Field Shielding Effectiveness for the SiP Module. IEEE Transactions on Electromagnetic Compatibility. https://doi.org/10.1109/temc.2017.2712719

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