Hardware for production test of RFID interface embedded into chips for smart cards and labels used in contactless applications
- DOI
- 10.1109/test.2000.894241
- Published
- Not recorded
- Container
- Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)
- Publisher
- Int. Test Conference
- Open access
- unknown
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uncertain Score 58/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.1109/test.2000.894241,
title = {Hardware for production test of RFID interface embedded into chips for smart cards and labels used in contactless applications},
author = {C. da Costa},
journal = {Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)},
doi = {10.1109/test.2000.894241},
url = {https://doi.org/10.1109/test.2000.894241}
}RIS
TY - JOUR TI - Hardware for production test of RFID interface embedded into chips for smart cards and labels used in contactless applications AU - C. da Costa JO - Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) DO - 10.1109/test.2000.894241 UR - https://doi.org/10.1109/test.2000.894241 ER -
APA
Costa, C. D. (n.d.). Hardware for production test of RFID interface embedded into chips for smart cards and labels used in contactless applications. Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159). https://doi.org/10.1109/test.2000.894241
Source records
- crossref · retrieved 2026-09-25T00:47:52.369Z