Power driven chaining of flip-flops in scan architectures
- DOI
- 10.1109/test.2002.1041833
- Published
- Not recorded
- Container
- Proceedings. International Test Conference
- Publisher
- IEEE
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/test.2002.1041833,
title = {Power driven chaining of flip-flops in scan architectures},
author = {Y. Bonhomme and P. Girard and C. Landrault and S. Pravossoudovitch},
journal = {Proceedings. International Test Conference},
doi = {10.1109/test.2002.1041833},
url = {https://doi.org/10.1109/test.2002.1041833}
}RIS
TY - JOUR TI - Power driven chaining of flip-flops in scan architectures AU - Y. Bonhomme AU - P. Girard AU - C. Landrault AU - S. Pravossoudovitch JO - Proceedings. International Test Conference DO - 10.1109/test.2002.1041833 UR - https://doi.org/10.1109/test.2002.1041833 ER -
APA
Bonhomme, Y., Girard, P., Landrault, C., & Pravossoudovitch, S. (n.d.). Power driven chaining of flip-flops in scan architectures. Proceedings. International Test Conference. https://doi.org/10.1109/test.2002.1041833
Source records
- crossref · retrieved 2026-11-04T11:39:37.235Z