Improved Extended Kalman Filter Estimation using Threshold Signal Detection with a MEMS Electrostatic Microscanner.

Chen Y, Li H, Qiu Z, Wang TD, Oldham KR.

DOI: 10.1109/tie.2019.2901663
Published: 2019-03-04
Container: IEEE Trans Ind Electron
Publisher: Not recorded
Open access: no

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Cite this work

BibTeX

@article{allodium:10.1109/tie.2019.2901663,
  title = {Improved Extended Kalman Filter Estimation using Threshold Signal Detection with a MEMS Electrostatic Microscanner.},
  author = {Chen Y and  Li H and  Qiu Z and  Wang TD and  Oldham KR.},
  year = {2020},
  journal = {IEEE Trans Ind Electron},
  doi = {10.1109/tie.2019.2901663},
  url = {https://doi.org/10.1109/tie.2019.2901663}
}

RIS

TY  - JOUR
TI  - Improved Extended Kalman Filter Estimation using Threshold Signal Detection with a MEMS Electrostatic Microscanner.
AU  - Chen Y
AU  -  Li H
AU  -  Qiu Z
AU  -  Wang TD
AU  -  Oldham KR.
PY  - 2020
JO  - IEEE Trans Ind Electron
DO  - 10.1109/tie.2019.2901663
UR  - https://doi.org/10.1109/tie.2019.2901663
ER  -

APA

Y, C., H, L., Z, Q., TD, W., & KR., O. (2020). Improved Extended Kalman Filter Estimation using Threshold Signal Detection with a MEMS Electrostatic Microscanner.. IEEE Trans Ind Electron. https://doi.org/10.1109/tie.2019.2901663

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europe-pmc · retrieved 2026-09-26T03:19:25.246Z