Improved Extended Kalman Filter Estimation Using Threshold Signal Detection With an MEMS Electrostatic Microscanner
- DOI
- 10.1109/tie.2019.2901663
- Published
- 2020-02
- Container
- IEEE Transactions on Industrial Electronics
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/tie.2019.2901663,
title = {Improved Extended Kalman Filter Estimation Using Threshold Signal Detection With an MEMS Electrostatic Microscanner},
author = {Yi Chen and Haijun Li and Zhen Qiu and Thomas D. Wang and Kenn R. Oldham},
year = {2020},
journal = {IEEE Transactions on Industrial Electronics},
doi = {10.1109/tie.2019.2901663},
url = {https://doi.org/10.1109/tie.2019.2901663}
}RIS
TY - JOUR TI - Improved Extended Kalman Filter Estimation Using Threshold Signal Detection With an MEMS Electrostatic Microscanner AU - Yi Chen AU - Haijun Li AU - Zhen Qiu AU - Thomas D. Wang AU - Kenn R. Oldham PY - 2020 JO - IEEE Transactions on Industrial Electronics DO - 10.1109/tie.2019.2901663 UR - https://doi.org/10.1109/tie.2019.2901663 ER -
APA
Chen, Y., Li, H., Qiu, Z., Wang, T. D., & Oldham, K. R. (2020). Improved Extended Kalman Filter Estimation Using Threshold Signal Detection With an MEMS Electrostatic Microscanner. IEEE Transactions on Industrial Electronics. https://doi.org/10.1109/tie.2019.2901663
Source records
- crossref · retrieved 2026-11-10T15:54:24.464Z