Image Copy-Move Forgery Detection via Deep PatchMatch and Pairwise Ranking Learning

Yuanman Li, Yingjie He, Changsheng Chen, Li Dong, Bin Li, Jiantao Zhou, Xia Li

Open source

DOI: 10.1109/tip.2024.3482191
Published: 2025
Container: IEEE Transactions on Image Processing
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1109/tip.2024.3482191,
  title = {Image Copy-Move Forgery Detection via Deep PatchMatch and Pairwise Ranking Learning},
  author = {Yuanman Li and Yingjie He and Changsheng Chen and Li Dong and Bin Li and Jiantao Zhou and Xia Li},
  year = {2025},
  journal = {IEEE Transactions on Image Processing},
  doi = {10.1109/tip.2024.3482191},
  url = {https://doi.org/10.1109/tip.2024.3482191}
}

RIS

TY  - JOUR
TI  - Image Copy-Move Forgery Detection via Deep PatchMatch and Pairwise Ranking Learning
AU  - Yuanman Li
AU  - Yingjie He
AU  - Changsheng Chen
AU  - Li Dong
AU  - Bin Li
AU  - Jiantao Zhou
AU  - Xia Li
PY  - 2025
JO  - IEEE Transactions on Image Processing
DO  - 10.1109/tip.2024.3482191
UR  - https://doi.org/10.1109/tip.2024.3482191
ER  -

APA

Li, Y., He, Y., Chen, C., Dong, L., Li, B., Zhou, J., & Li, X. (2025). Image Copy-Move Forgery Detection via Deep PatchMatch and Pairwise Ranking Learning. IEEE Transactions on Image Processing. https://doi.org/10.1109/tip.2024.3482191

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crossref · retrieved 2026-09-24T20:13:16.744Z