Dynamic Atomic Column Detection in Transmission Electron Microscopy Videos via Ridge Estimation

Yuchen Xu, Andrew M. Thomas, Peter A. Crozier, David S. Matteson

Open source

DOI
10.1109/tip.2025.3543138
Published
2025
Container
IEEE Transactions on Image Processing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

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BibTeX

@article{allodium:10.1109/tip.2025.3543138,
  title = {Dynamic Atomic Column Detection in Transmission Electron Microscopy Videos via Ridge Estimation},
  author = {Yuchen Xu and Andrew M. Thomas and Peter A. Crozier and David S. Matteson},
  year = {2025},
  journal = {IEEE Transactions on Image Processing},
  doi = {10.1109/tip.2025.3543138},
  url = {https://doi.org/10.1109/tip.2025.3543138}
}

RIS

TY  - JOUR
TI  - Dynamic Atomic Column Detection in Transmission Electron Microscopy Videos via Ridge Estimation
AU  - Yuchen Xu
AU  - Andrew M. Thomas
AU  - Peter A. Crozier
AU  - David S. Matteson
PY  - 2025
JO  - IEEE Transactions on Image Processing
DO  - 10.1109/tip.2025.3543138
UR  - https://doi.org/10.1109/tip.2025.3543138
ER  - 

APA

Xu, Y., Thomas, A. M., Crozier, P. A., & Matteson, D. S. (2025). Dynamic Atomic Column Detection in Transmission Electron Microscopy Videos via Ridge Estimation. IEEE Transactions on Image Processing. https://doi.org/10.1109/tip.2025.3543138

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