DeepMURE: Deep Self-Supervised Despeckling via Monte Carlo Multiplicative Unbiased Risk Estimation

Ashutosh Gupta, Chandra Sekhar Seelamantula, Thierry Blu, Tanish Yelgoe, Nitant Dube, Shanmuganathan Raman

Open source

DOI
10.1109/tip.2026.3746434
Published
2026
Container
IEEE Transactions on Image Processing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1109/tip.2026.3746434,
  title = {DeepMURE: Deep Self-Supervised Despeckling via Monte Carlo Multiplicative Unbiased Risk Estimation},
  author = {Ashutosh Gupta and Chandra Sekhar Seelamantula and Thierry Blu and Tanish Yelgoe and Nitant Dube and Shanmuganathan Raman},
  year = {2026},
  journal = {IEEE Transactions on Image Processing},
  doi = {10.1109/tip.2026.3746434},
  url = {https://doi.org/10.1109/tip.2026.3746434}
}

RIS

TY  - JOUR
TI  - DeepMURE: Deep Self-Supervised Despeckling via Monte Carlo Multiplicative Unbiased Risk Estimation
AU  - Ashutosh Gupta
AU  - Chandra Sekhar Seelamantula
AU  - Thierry Blu
AU  - Tanish Yelgoe
AU  - Nitant Dube
AU  - Shanmuganathan Raman
PY  - 2026
JO  - IEEE Transactions on Image Processing
DO  - 10.1109/tip.2026.3746434
UR  - https://doi.org/10.1109/tip.2026.3746434
ER  - 

APA

Gupta, A., Seelamantula, C. S., Blu, T., Yelgoe, T., Dube, N., & Raman, S. (2026). DeepMURE: Deep Self-Supervised Despeckling via Monte Carlo Multiplicative Unbiased Risk Estimation. IEEE Transactions on Image Processing. https://doi.org/10.1109/tip.2026.3746434

Source records