Off-Axis Electron Holography as a Tool for the Mapping of Electromagnetic Properties in the Semiconductor Industry

David Cooper, Victor Boureau, Trevor P. Almeida

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DOI: 10.1109/tmat.2024.3482284
Published: 2024
Container: IEEE Transactions on Materials for Electron Devices
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1109/tmat.2024.3482284,
  title = {Off-Axis Electron Holography as a Tool for the Mapping of Electromagnetic Properties in the Semiconductor Industry},
  author = {David Cooper and Victor Boureau and Trevor P. Almeida},
  year = {2024},
  journal = {IEEE Transactions on Materials for Electron Devices},
  doi = {10.1109/tmat.2024.3482284},
  url = {https://doi.org/10.1109/tmat.2024.3482284}
}

RIS

TY  - JOUR
TI  - Off-Axis Electron Holography as a Tool for the Mapping of Electromagnetic Properties in the Semiconductor Industry
AU  - David Cooper
AU  - Victor Boureau
AU  - Trevor P. Almeida
PY  - 2024
JO  - IEEE Transactions on Materials for Electron Devices
DO  - 10.1109/tmat.2024.3482284
UR  - https://doi.org/10.1109/tmat.2024.3482284
ER  -

APA

Cooper, D., Boureau, V., & Almeida, T. P. (2024). Off-Axis Electron Holography as a Tool for the Mapping of Electromagnetic Properties in the Semiconductor Industry. IEEE Transactions on Materials for Electron Devices. https://doi.org/10.1109/tmat.2024.3482284

Source records

crossref · retrieved 2026-09-26T21:47:36.448Z