Significance Tests of Feature Relevance for a Black-Box Learner

Ben Dai, Xiaotong Shen, Wei Pan

Open source

DOI: 10.1109/tnnls.2022.3185742
Published: 2024-02
Container: IEEE Transactions on Neural Networks and Learning Systems
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1109/tnnls.2022.3185742,
  title = {Significance Tests of Feature Relevance for a Black-Box Learner},
  author = {Ben Dai and Xiaotong Shen and Wei Pan},
  year = {2024},
  journal = {IEEE Transactions on Neural Networks and Learning Systems},
  doi = {10.1109/tnnls.2022.3185742},
  url = {https://doi.org/10.1109/tnnls.2022.3185742}
}

RIS

TY  - JOUR
TI  - Significance Tests of Feature Relevance for a Black-Box Learner
AU  - Ben Dai
AU  - Xiaotong Shen
AU  - Wei Pan
PY  - 2024
JO  - IEEE Transactions on Neural Networks and Learning Systems
DO  - 10.1109/tnnls.2022.3185742
UR  - https://doi.org/10.1109/tnnls.2022.3185742
ER  -

APA

Dai, B., Shen, X., & Pan, W. (2024). Significance Tests of Feature Relevance for a Black-Box Learner. IEEE Transactions on Neural Networks and Learning Systems. https://doi.org/10.1109/tnnls.2022.3185742

Source records

crossref · retrieved 2026-09-26T07:11:04.235Z