Total-dose and single-event effects in DC/DC converter control circuitry

P.C. Adell, R.D. Schrimpf, W.T. Holman, J. Boch, J. Stacey, P. Ribero, A. Sternberg, K.F. Galloway

Open source

DOI
10.1109/tns.2003.820757
Published
2003-12
Container
IEEE Transactions on Nuclear Science
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

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BibTeX

@article{allodium:10.1109/tns.2003.820757,
  title = {Total-dose and single-event effects in DC/DC converter control circuitry},
  author = {P.C. Adell and R.D. Schrimpf and W.T. Holman and J. Boch and J. Stacey and P. Ribero and A. Sternberg and K.F. Galloway},
  year = {2003},
  journal = {IEEE Transactions on Nuclear Science},
  doi = {10.1109/tns.2003.820757},
  url = {https://doi.org/10.1109/tns.2003.820757}
}

RIS

TY  - JOUR
TI  - Total-dose and single-event effects in DC/DC converter control circuitry
AU  - P.C. Adell
AU  - R.D. Schrimpf
AU  - W.T. Holman
AU  - J. Boch
AU  - J. Stacey
AU  - P. Ribero
AU  - A. Sternberg
AU  - K.F. Galloway
PY  - 2003
JO  - IEEE Transactions on Nuclear Science
DO  - 10.1109/tns.2003.820757
UR  - https://doi.org/10.1109/tns.2003.820757
ER  - 

APA

Adell, P., Schrimpf, R., Holman, W., Boch, J., Stacey, J., Ribero, P., Sternberg, A., & Galloway, K. (2003). Total-dose and single-event effects in DC/DC converter control circuitry. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/tns.2003.820757

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