Characterization of Thick Selenium Layers for Dual-Layer X-ray Imaging.

Swaby A, Hellier K, Shi L, Wang AS, Abbaszadeh S

DOI: 10.1109/tns.2025.3650559
Published: 2026 Jan 5
Container: IEEE transactions on nuclear science
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1109/tns.2025.3650559,
  title = {Characterization of Thick Selenium Layers for Dual-Layer X-ray Imaging.},
  author = {Swaby A and Hellier K and Shi L and Wang AS and Abbaszadeh S},
  year = {2026},
  journal = {IEEE transactions on nuclear science},
  doi = {10.1109/tns.2025.3650559},
  url = {https://doi.org/10.1109/tns.2025.3650559}
}

RIS

TY  - JOUR
TI  - Characterization of Thick Selenium Layers for Dual-Layer X-ray Imaging.
AU  - Swaby A
AU  - Hellier K
AU  - Shi L
AU  - Wang AS
AU  - Abbaszadeh S
PY  - 2026
JO  - IEEE transactions on nuclear science
DO  - 10.1109/tns.2025.3650559
UR  - https://doi.org/10.1109/tns.2025.3650559
ER  -

APA

A, S., K, H., L, S., AS, W., & S, A. (2026). Characterization of Thick Selenium Layers for Dual-Layer X-ray Imaging.. IEEE transactions on nuclear science. https://doi.org/10.1109/tns.2025.3650559

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pubmed · retrieved 2026-09-25T19:57:21.306Z