Uncertainty Quantification in Detection Transformers: Object-Level Calibration and Image-Level Reliability

Young-Jin Park, Carson Sobolewski, Navid Azizan

Open source

DOI
10.1109/tpami.2026.3686715
Published
2026-11
Container
IEEE Transactions on Pattern Analysis and Machine Intelligence
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

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BibTeX

@article{allodium:10.1109/tpami.2026.3686715,
  title = {Uncertainty Quantification in Detection Transformers: Object-Level Calibration and Image-Level Reliability},
  author = {Young-Jin Park and Carson Sobolewski and Navid Azizan},
  year = {2026},
  journal = {IEEE Transactions on Pattern Analysis and Machine Intelligence},
  doi = {10.1109/tpami.2026.3686715},
  url = {https://doi.org/10.1109/tpami.2026.3686715}
}

RIS

TY  - JOUR
TI  - Uncertainty Quantification in Detection Transformers: Object-Level Calibration and Image-Level Reliability
AU  - Young-Jin Park
AU  - Carson Sobolewski
AU  - Navid Azizan
PY  - 2026
JO  - IEEE Transactions on Pattern Analysis and Machine Intelligence
DO  - 10.1109/tpami.2026.3686715
UR  - https://doi.org/10.1109/tpami.2026.3686715
ER  - 

APA

Park, Y., Sobolewski, C., & Azizan, N. (2026). Uncertainty Quantification in Detection Transformers: Object-Level Calibration and Image-Level Reliability. IEEE Transactions on Pattern Analysis and Machine Intelligence. https://doi.org/10.1109/tpami.2026.3686715

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