Learning Topology-Aware Representations via Test-Time Adaptation for Anomaly Segmentation
- DOI
- 10.1109/tpami.2026.3710196
- Published
- 2026-10
- Container
- IEEE Transactions on Pattern Analysis and Machine Intelligence
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/tpami.2026.3710196,
title = {Learning Topology-Aware Representations via Test-Time Adaptation for Anomaly Segmentation},
author = {Ali Zia and Usman Ali and Abdul Rehman and Umer Ramzan and Kang Han and Muhammad Faheem and Shahnawaz Qureshi and Wei Xiang},
year = {2026},
journal = {IEEE Transactions on Pattern Analysis and Machine Intelligence},
doi = {10.1109/tpami.2026.3710196},
url = {https://doi.org/10.1109/tpami.2026.3710196}
}RIS
TY - JOUR TI - Learning Topology-Aware Representations via Test-Time Adaptation for Anomaly Segmentation AU - Ali Zia AU - Usman Ali AU - Abdul Rehman AU - Umer Ramzan AU - Kang Han AU - Muhammad Faheem AU - Shahnawaz Qureshi AU - Wei Xiang PY - 2026 JO - IEEE Transactions on Pattern Analysis and Machine Intelligence DO - 10.1109/tpami.2026.3710196 UR - https://doi.org/10.1109/tpami.2026.3710196 ER -
APA
Zia, A., Ali, U., Rehman, A., Ramzan, U., Han, K., Faheem, M., Qureshi, S., & Xiang, W. (2026). Learning Topology-Aware Representations via Test-Time Adaptation for Anomaly Segmentation. IEEE Transactions on Pattern Analysis and Machine Intelligence. https://doi.org/10.1109/tpami.2026.3710196
Source records
- crossref · retrieved 2026-09-25T04:29:53.641Z