Learning Topology-Aware Representations via Test-Time Adaptation for Anomaly Segmentation

Ali Zia, Usman Ali, Abdul Rehman, Umer Ramzan, Kang Han, Muhammad Faheem, Shahnawaz Qureshi, Wei Xiang

Open source

DOI
10.1109/tpami.2026.3710196
Published
2026-10
Container
IEEE Transactions on Pattern Analysis and Machine Intelligence
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Open access
unknown

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BibTeX

@article{allodium:10.1109/tpami.2026.3710196,
  title = {Learning Topology-Aware Representations via Test-Time Adaptation for Anomaly Segmentation},
  author = {Ali Zia and Usman Ali and Abdul Rehman and Umer Ramzan and Kang Han and Muhammad Faheem and Shahnawaz Qureshi and Wei Xiang},
  year = {2026},
  journal = {IEEE Transactions on Pattern Analysis and Machine Intelligence},
  doi = {10.1109/tpami.2026.3710196},
  url = {https://doi.org/10.1109/tpami.2026.3710196}
}

RIS

TY  - JOUR
TI  - Learning Topology-Aware Representations via Test-Time Adaptation for Anomaly Segmentation
AU  - Ali Zia
AU  - Usman Ali
AU  - Abdul Rehman
AU  - Umer Ramzan
AU  - Kang Han
AU  - Muhammad Faheem
AU  - Shahnawaz Qureshi
AU  - Wei Xiang
PY  - 2026
JO  - IEEE Transactions on Pattern Analysis and Machine Intelligence
DO  - 10.1109/tpami.2026.3710196
UR  - https://doi.org/10.1109/tpami.2026.3710196
ER  - 

APA

Zia, A., Ali, U., Rehman, A., Ramzan, U., Han, K., Faheem, M., Qureshi, S., & Xiang, W. (2026). Learning Topology-Aware Representations via Test-Time Adaptation for Anomaly Segmentation. IEEE Transactions on Pattern Analysis and Machine Intelligence. https://doi.org/10.1109/tpami.2026.3710196

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