Single-Qubit Fidelity Assessment of Quantum Annealing Hardware

Jon Nelson, Marc Vuffray, Andrey Y. Lokhov, Carleton Coffrin Coffrin

Open source

DOI
10.1109/tqe.2021.3092710
Published
2021
Container
IEEE Transactions on Quantum Engineering
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1109/tqe.2021.3092710,
  title = {Single-Qubit Fidelity Assessment of Quantum Annealing Hardware},
  author = {Jon Nelson and Marc Vuffray and Andrey Y. Lokhov and Carleton Coffrin Coffrin},
  year = {2021},
  journal = {IEEE Transactions on Quantum Engineering},
  doi = {10.1109/tqe.2021.3092710},
  url = {https://doi.org/10.1109/tqe.2021.3092710}
}

RIS

TY  - JOUR
TI  - Single-Qubit Fidelity Assessment of Quantum Annealing Hardware
AU  - Jon Nelson
AU  - Marc Vuffray
AU  - Andrey Y. Lokhov
AU  - Carleton Coffrin Coffrin
PY  - 2021
JO  - IEEE Transactions on Quantum Engineering
DO  - 10.1109/tqe.2021.3092710
UR  - https://doi.org/10.1109/tqe.2021.3092710
ER  - 

APA

Nelson, J., Vuffray, M., Lokhov, A. Y., & Coffrin, C. C. (2021). Single-Qubit Fidelity Assessment of Quantum Annealing Hardware. IEEE Transactions on Quantum Engineering. https://doi.org/10.1109/tqe.2021.3092710

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