Combinatorial Test Generation for Multiple Input Models with Shared Parameters.
- DOI
- 10.1109/tse.2021.3065950
- Published
- 2022 Jul
- Container
- IEEE transactions on pattern analysis and machine intelligence
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1109/tse.2021.3065950,
title = {Combinatorial Test Generation for Multiple Input Models with Shared Parameters.},
author = {Rao C and Li N and Lei Y and Guo J and Zhang Y and Kacker RN and Kuhn DR},
year = {2022},
journal = {IEEE transactions on pattern analysis and machine intelligence},
doi = {10.1109/tse.2021.3065950},
url = {https://doi.org/10.1109/tse.2021.3065950}
}RIS
TY - JOUR TI - Combinatorial Test Generation for Multiple Input Models with Shared Parameters. AU - Rao C AU - Li N AU - Lei Y AU - Guo J AU - Zhang Y AU - Kacker RN AU - Kuhn DR PY - 2022 JO - IEEE transactions on pattern analysis and machine intelligence DO - 10.1109/tse.2021.3065950 UR - https://doi.org/10.1109/tse.2021.3065950 ER -
APA
C, R., N, L., Y, L., J, G., Y, Z., RN, K., & DR, K. (2022). Combinatorial Test Generation for Multiple Input Models with Shared Parameters.. IEEE transactions on pattern analysis and machine intelligence. https://doi.org/10.1109/tse.2021.3065950
Source records
- pubmed · retrieved 2026-11-10T19:51:10.441Z