Resonant spectrum method to characterize piezoelectric films in composite resonators.
- DOI
- 10.1109/tuffc.2003.1193626
- Published
- 2003 Mar
- Container
- IEEE transactions on ultrasonics, ferroelectrics, and frequency control
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/tuffc.2003.1193626,
title = {Resonant spectrum method to characterize piezoelectric films in composite resonators.},
author = {Zhang Y and Wang Z and Cheeke JD},
year = {2003},
journal = {IEEE transactions on ultrasonics, ferroelectrics, and frequency control},
doi = {10.1109/tuffc.2003.1193626},
url = {https://doi.org/10.1109/tuffc.2003.1193626}
}RIS
TY - JOUR TI - Resonant spectrum method to characterize piezoelectric films in composite resonators. AU - Zhang Y AU - Wang Z AU - Cheeke JD PY - 2003 JO - IEEE transactions on ultrasonics, ferroelectrics, and frequency control DO - 10.1109/tuffc.2003.1193626 UR - https://doi.org/10.1109/tuffc.2003.1193626 ER -
APA
Y, Z., Z, W., & JD, C. (2003). Resonant spectrum method to characterize piezoelectric films in composite resonators.. IEEE transactions on ultrasonics, ferroelectrics, and frequency control. https://doi.org/10.1109/tuffc.2003.1193626
Source records
- pubmed · retrieved 2026-09-26T22:03:30.366Z