Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation
- DOI
- 10.1109/tvlsi.2012.2197427
- Published
- 2013-05
- Container
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1109/tvlsi.2012.2197427,
title = {Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation},
author = {Aida Todri and Alberto Bosio and Luigi Dilillo and Patrick Girard and Arnaud Virazel},
year = {2013},
journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
doi = {10.1109/tvlsi.2012.2197427},
url = {https://doi.org/10.1109/tvlsi.2012.2197427}
}RIS
TY - JOUR TI - Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation AU - Aida Todri AU - Alberto Bosio AU - Luigi Dilillo AU - Patrick Girard AU - Arnaud Virazel PY - 2013 JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems DO - 10.1109/tvlsi.2012.2197427 UR - https://doi.org/10.1109/tvlsi.2012.2197427 ER -
APA
Todri, A., Bosio, A., Dilillo, L., Girard, P., & Virazel, A. (2013). Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. https://doi.org/10.1109/tvlsi.2012.2197427
Source records
- crossref · retrieved 2026-09-25T14:14:19.016Z