Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology
- DOI
- 10.1109/vlsitechnologyandcir46783.2024.10631465
- Published
- 2024-06-16
- Container
- 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
- Publisher
- IEEE
- Open access
- unknown
Credibility signals
uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
Show all credibility signals
- supportingDOI registered: A matching record was returned by Crossref.
- supportingDOI resolves: A matching record was returned by Crossref.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredOpen access status: Not checked or no result supplied; no credibility inference made.
- not scoredPublication license: Not checked or no result supplied; no credibility inference made.
- not scoredPublication version: A publication version was supplied but is not scored.
- supportingMetadata completeness: All 6 scored descriptive metadata groups are present.
Cite this work
BibTeX
@article{allodium:10.1109/vlsitechnologyandcir46783.2024.10631465,
title = {Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology},
author = {T. V. Dinh and S-W. Tam and A. J. Scholten and L. Tondelli and R. M. T. Pijper and S. H. Kondapalli and J. Xie and A. Wong and I. To and R. Asanovski and L. Selmi},
year = {2024},
journal = {2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)},
doi = {10.1109/vlsitechnologyandcir46783.2024.10631465},
url = {https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631465}
}RIS
TY - JOUR TI - Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology AU - T. V. Dinh AU - S-W. Tam AU - A. J. Scholten AU - L. Tondelli AU - R. M. T. Pijper AU - S. H. Kondapalli AU - J. Xie AU - A. Wong AU - I. To AU - R. Asanovski AU - L. Selmi PY - 2024 JO - 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) DO - 10.1109/vlsitechnologyandcir46783.2024.10631465 UR - https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631465 ER -
APA
Dinh, T. V., Tam, S., Scholten, A. J., Tondelli, L., Pijper, R. M. T., Kondapalli, S. H., Xie, J., Wong, A., To, I., Asanovski, R., & Selmi, L. (2024). Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology. 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits). https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631465
Source records
- crossref · retrieved 2026-09-25T20:34:11.953Z