Characterization of the surface properties of commercially available dental implants using scanning electron microscopy, focused ion beam, and high-resolution transmission electron microscopy.
- DOI
- 10.1111/j.1708-8208.2007.00056.x
- Published
- 2008 Mar
- Container
- Clinical implant dentistry and related research
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1111/j.1708-8208.2007.00056.x,
title = {Characterization of the surface properties of commercially available dental implants using scanning electron microscopy, focused ion beam, and high-resolution transmission electron microscopy.},
author = {Jarmar T and Palmquist A and Brånemark R and Hermansson L and Engqvist H and Thomsen P},
year = {2008},
journal = {Clinical implant dentistry and related research},
doi = {10.1111/j.1708-8208.2007.00056.x},
url = {https://doi.org/10.1111/j.1708-8208.2007.00056.x}
}RIS
TY - JOUR TI - Characterization of the surface properties of commercially available dental implants using scanning electron microscopy, focused ion beam, and high-resolution transmission electron microscopy. AU - Jarmar T AU - Palmquist A AU - Brånemark R AU - Hermansson L AU - Engqvist H AU - Thomsen P PY - 2008 JO - Clinical implant dentistry and related research DO - 10.1111/j.1708-8208.2007.00056.x UR - https://doi.org/10.1111/j.1708-8208.2007.00056.x ER -
APA
T, J., A, P., R, B., L, H., H, E., & P, T. (2008). Characterization of the surface properties of commercially available dental implants using scanning electron microscopy, focused ion beam, and high-resolution transmission electron microscopy.. Clinical implant dentistry and related research. https://doi.org/10.1111/j.1708-8208.2007.00056.x
Source records
- pubmed · retrieved 2026-09-25T21:08:55.042Z