Recommended conditions for low kV 'sweet spot' imaging of battery materials.

Mitchell RL, Khan R, Wheatcroft L, Png K, Trenikhina Y

DOI: 10.1111/jmi.70181
Published: 2026 Sep 28
Container: Journal of microscopy
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1111/jmi.70181,
  title = {Recommended conditions for low kV 'sweet spot' imaging of battery materials.},
  author = {Mitchell RL and Khan R and Wheatcroft L and Png K and Trenikhina Y},
  year = {2026},
  journal = {Journal of microscopy},
  doi = {10.1111/jmi.70181},
  url = {https://doi.org/10.1111/jmi.70181}
}

RIS

TY  - JOUR
TI  - Recommended conditions for low kV 'sweet spot' imaging of battery materials.
AU  - Mitchell RL
AU  - Khan R
AU  - Wheatcroft L
AU  - Png K
AU  - Trenikhina Y
PY  - 2026
JO  - Journal of microscopy
DO  - 10.1111/jmi.70181
UR  - https://doi.org/10.1111/jmi.70181
ER  -

APA

RL, M., R, K., L, W., K, P., & Y, T. (2026). Recommended conditions for low kV 'sweet spot' imaging of battery materials.. Journal of microscopy. https://doi.org/10.1111/jmi.70181

Source records

pubmed · retrieved 2026-11-10T06:06:41.883Z