Metamorphic heterojunction bipolar transistors and P–I–N photodiodes on GaAs substrates prepared by molecular beam epitaxy

W. E. Hoke, P. J. Lemonias, T. D. Kennedy, A. Torabi, E. K. Tong, R. J. Bourque, J.-H. Jang, G. Cueva, D. C. Dumka, I. Adesida, K. L. Chang, K. C. Hsieh

Open source

DOI
10.1116/1.1374624
Published
2001-07-01
Container
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Publisher
American Vacuum Society
Open access
unknown

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BibTeX

@article{allodium:10.1116/1.1374624,
  title = {Metamorphic heterojunction bipolar transistors and P–I–N photodiodes on GaAs substrates prepared by molecular beam epitaxy},
  author = {W. E. Hoke and P. J. Lemonias and T. D. Kennedy and A. Torabi and E. K. Tong and R. J. Bourque and J.-H. Jang and G. Cueva and D. C. Dumka and I. Adesida and K. L. Chang and K. C. Hsieh},
  year = {2001},
  journal = {Journal of Vacuum Science \& Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena},
  doi = {10.1116/1.1374624},
  url = {https://doi.org/10.1116/1.1374624}
}

RIS

TY  - JOUR
TI  - Metamorphic heterojunction bipolar transistors and P–I–N photodiodes on GaAs substrates prepared by molecular beam epitaxy
AU  - W. E. Hoke
AU  - P. J. Lemonias
AU  - T. D. Kennedy
AU  - A. Torabi
AU  - E. K. Tong
AU  - R. J. Bourque
AU  - J.-H. Jang
AU  - G. Cueva
AU  - D. C. Dumka
AU  - I. Adesida
AU  - K. L. Chang
AU  - K. C. Hsieh
PY  - 2001
JO  - Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
DO  - 10.1116/1.1374624
UR  - https://doi.org/10.1116/1.1374624
ER  - 

APA

Hoke, W. E., Lemonias, P. J., Kennedy, T. D., Torabi, A., Tong, E. K., Bourque, R. J., Jang, J., Cueva, G., Dumka, D. C., Adesida, I., Chang, K. L., & Hsieh, K. C. (2001). Metamorphic heterojunction bipolar transistors and P–I–N photodiodes on GaAs substrates prepared by molecular beam epitaxy. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena. https://doi.org/10.1116/1.1374624

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