Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene

Benjamen P. Reed, David J. H. Cant, Steve J. Spencer, Abraham Jorge Carmona-Carmona, Adam Bushell, Alberto Herrera-Gómez, Akira Kurokawa, Andreas Thissen, Andrew G. Thomas, Andrew J. Britton, Andrzej Bernasik, Anne Fuchs, Arthur P. Baddorf, Bernd Bock, Bill Theilacker, Bin Cheng, David G. Castner, David J. Morgan, David Valley, Elizabeth A. Willneff, Emily F. Smith, Emmanuel Nolot, Fangyan Xie, Gilad Zorn, Graham C. Smith, Hideyuki Yasufuku, Jeffery L. Fenton, Jian Chen, Jonathan D. P. Counsell, Jörg Radnik, Karen J. Gaskell, Kateryna Artyushkova, Li Yang, Lulu Zhang, Makiho Eguchi, Marc Walker, Mariusz Hajdyła, Mateusz M. Marzec, Matthew R. Linford, Naoyoshi Kubota, Orlando Cortazar-Martínez, Paul Dietrich, Riki Satoh, Sven L. M. Schroeder, Tahereh G. Avval, Takaharu Nagatomi, Vincent Fernandez, Wayne Lake, Yasushi Azuma, Yusuke Yoshikawa, Alexander G. Shard

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DOI: 10.1116/6.0000577
Published: 2020-11-23
Container: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Publisher: American Vacuum Society
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1116/6.0000577,
  title = {Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene},
  author = {Benjamen P. Reed and David J. H. Cant and Steve J. Spencer and Abraham Jorge Carmona-Carmona and Adam Bushell and Alberto Herrera-Gómez and Akira Kurokawa and Andreas Thissen and Andrew G. Thomas and Andrew J. Britton and Andrzej Bernasik and Anne Fuchs and Arthur P. Baddorf and Bernd Bock and Bill Theilacker and Bin Cheng and David G. Castner and David J. Morgan and David Valley and Elizabeth A. Willneff and Emily F. Smith and Emmanuel Nolot and Fangyan Xie and Gilad Zorn and Graham C. Smith and Hideyuki Yasufuku and Jeffery L. Fenton and Jian Chen and Jonathan D. P. Counsell and Jörg Radnik and Karen J. Gaskell and Kateryna Artyushkova and Li Yang and Lulu Zhang and Makiho Eguchi and Marc Walker and Mariusz Hajdyła and Mateusz M. Marzec and Matthew R. Linford and Naoyoshi Kubota and Orlando Cortazar-Martínez and Paul Dietrich and Riki Satoh and Sven L. M. Schroeder and Tahereh G. Avval and Takaharu Nagatomi and Vincent Fernandez and Wayne Lake and Yasushi Azuma and Yusuke Yoshikawa and Alexander G. Shard},
  year = {2020},
  journal = {Journal of Vacuum Science \&amp; Technology A: Vacuum, Surfaces, and Films},
  doi = {10.1116/6.0000577},
  url = {https://doi.org/10.1116/6.0000577}
}

RIS

TY  - JOUR
TI  - Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene
AU  - Benjamen P. Reed
AU  - David J. H. Cant
AU  - Steve J. Spencer
AU  - Abraham Jorge Carmona-Carmona
AU  - Adam Bushell
AU  - Alberto Herrera-Gómez
AU  - Akira Kurokawa
AU  - Andreas Thissen
AU  - Andrew G. Thomas
AU  - Andrew J. Britton
AU  - Andrzej Bernasik
AU  - Anne Fuchs
AU  - Arthur P. Baddorf
AU  - Bernd Bock
AU  - Bill Theilacker
AU  - Bin Cheng
AU  - David G. Castner
AU  - David J. Morgan
AU  - David Valley
AU  - Elizabeth A. Willneff
AU  - Emily F. Smith
AU  - Emmanuel Nolot
AU  - Fangyan Xie
AU  - Gilad Zorn
AU  - Graham C. Smith
AU  - Hideyuki Yasufuku
AU  - Jeffery L. Fenton
AU  - Jian Chen
AU  - Jonathan D. P. Counsell
AU  - Jörg Radnik
AU  - Karen J. Gaskell
AU  - Kateryna Artyushkova
AU  - Li Yang
AU  - Lulu Zhang
AU  - Makiho Eguchi
AU  - Marc Walker
AU  - Mariusz Hajdyła
AU  - Mateusz M. Marzec
AU  - Matthew R. Linford
AU  - Naoyoshi Kubota
AU  - Orlando Cortazar-Martínez
AU  - Paul Dietrich
AU  - Riki Satoh
AU  - Sven L. M. Schroeder
AU  - Tahereh G. Avval
AU  - Takaharu Nagatomi
AU  - Vincent Fernandez
AU  - Wayne Lake
AU  - Yasushi Azuma
AU  - Yusuke Yoshikawa
AU  - Alexander G. Shard
PY  - 2020
JO  - Journal of Vacuum Science &amp; Technology A: Vacuum, Surfaces, and Films
DO  - 10.1116/6.0000577
UR  - https://doi.org/10.1116/6.0000577
ER  -

APA

Reed, B. P., Cant, D. J. H., Spencer, S. J., Carmona-Carmona, A. J., Bushell, A., Herrera-Gómez, A., Kurokawa, A., Thissen, A., Thomas, A. G., Britton, A. J., Bernasik, A., Fuchs, A., Baddorf, A. P., Bock, B., Theilacker, B., Cheng, B., Castner, D. G., Morgan, D. J., Valley, D., Willneff, E. A., Smith, E. F., Nolot, E., Xie, F., Zorn, G., Smith, G. C., Yasufuku, H., Fenton, J. L., Chen, J., Counsell, J. D. P., Radnik, J., Gaskell, K. J., Artyushkova, K., Yang, L., Zhang, L., Eguchi, M., Walker, M., Hajdyła, M., Marzec, M. M., Linford, M. R., Kubota, N., Cortazar-Martínez, O., Dietrich, P., Satoh, R., Schroeder, S. L. M., Avval, T. G., Nagatomi, T., Fernandez, V., Lake, W., Azuma, Y., Yoshikawa, Y., & Shard, A. G. (2020). Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. https://doi.org/10.1116/6.0000577

Source records

crossref · retrieved 2026-09-26T18:37:11.790Z