Characterization of TiO<sub>2</sub>thin films in the EUV and soft X-ray region

A. Comisso, A. Giglia, M. Nardello, E. Tessarolo, L. Calvillo, M. G. Sertsu, G. Granozzi, F. Gerlin, L. Brigo, P. Nicolosi

Open source

DOI
10.1117/12.2178142
Published
2015-05-12
Container
SPIE Proceedings
Publisher
SPIE
Open access
unknown

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BibTeX

@article{allodium:10.1117/12.2178142,
  title = {Characterization of TiO<sub>2</sub>thin films in the EUV and soft X-ray region},
  author = {A. Comisso and A. Giglia and M. Nardello and E. Tessarolo and L. Calvillo and M. G. Sertsu and G. Granozzi and F. Gerlin and L. Brigo and P. Nicolosi},
  year = {2015},
  journal = {SPIE Proceedings},
  doi = {10.1117/12.2178142},
  url = {https://doi.org/10.1117/12.2178142}
}

RIS

TY  - JOUR
TI  - Characterization of TiO<sub>2</sub>thin films in the EUV and soft X-ray region
AU  - A. Comisso
AU  - A. Giglia
AU  - M. Nardello
AU  - E. Tessarolo
AU  - L. Calvillo
AU  - M. G. Sertsu
AU  - G. Granozzi
AU  - F. Gerlin
AU  - L. Brigo
AU  - P. Nicolosi
PY  - 2015
JO  - SPIE Proceedings
DO  - 10.1117/12.2178142
UR  - https://doi.org/10.1117/12.2178142
ER  - 

APA

Comisso, A., Giglia, A., Nardello, M., Tessarolo, E., Calvillo, L., Sertsu, M. G., Granozzi, G., Gerlin, F., Brigo, L., & Nicolosi, P. (2015). Characterization of TiO<sub>2</sub>thin films in the EUV and soft X-ray region. SPIE Proceedings. https://doi.org/10.1117/12.2178142

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