Characterization of TiO<sub>2</sub>thin films in the EUV and soft X-ray region
- DOI
- 10.1117/12.2178142
- Published
- 2015-05-12
- Container
- SPIE Proceedings
- Publisher
- SPIE
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1117/12.2178142,
title = {Characterization of TiO<sub>2</sub>thin films in the EUV and soft X-ray region},
author = {A. Comisso and A. Giglia and M. Nardello and E. Tessarolo and L. Calvillo and M. G. Sertsu and G. Granozzi and F. Gerlin and L. Brigo and P. Nicolosi},
year = {2015},
journal = {SPIE Proceedings},
doi = {10.1117/12.2178142},
url = {https://doi.org/10.1117/12.2178142}
}RIS
TY - JOUR TI - Characterization of TiO<sub>2</sub>thin films in the EUV and soft X-ray region AU - A. Comisso AU - A. Giglia AU - M. Nardello AU - E. Tessarolo AU - L. Calvillo AU - M. G. Sertsu AU - G. Granozzi AU - F. Gerlin AU - L. Brigo AU - P. Nicolosi PY - 2015 JO - SPIE Proceedings DO - 10.1117/12.2178142 UR - https://doi.org/10.1117/12.2178142 ER -
APA
Comisso, A., Giglia, A., Nardello, M., Tessarolo, E., Calvillo, L., Sertsu, M. G., Granozzi, G., Gerlin, F., Brigo, L., & Nicolosi, P. (2015). Characterization of TiO<sub>2</sub>thin films in the EUV and soft X-ray region. SPIE Proceedings. https://doi.org/10.1117/12.2178142
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- crossref · retrieved 2026-09-26T14:03:40.407Z