Radiation-induced degradation of optoelectronic sensors
- DOI
- 10.1117/12.2532289
- Published
- 2019-10-09
- Container
- Electro-Optical and Infrared Systems: Technology and Applications XVI
- Publisher
- SPIE
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1117/12.2532289,
title = {Radiation-induced degradation of optoelectronic sensors},
author = {Christophe Inguimbert and Thierry Nuns and Dominique Hervé and Aurélien Vriet and Juan Barbero and Juan Moreno and Alexandru Nedelcu and Samuel Ducret and Olivier Saint-Pé and Franck Larnaudie and Olivier Gilard and Corinne Aicardi},
year = {2019},
journal = {Electro-Optical and Infrared Systems: Technology and Applications XVI},
doi = {10.1117/12.2532289},
url = {https://doi.org/10.1117/12.2532289}
}RIS
TY - JOUR TI - Radiation-induced degradation of optoelectronic sensors AU - Christophe Inguimbert AU - Thierry Nuns AU - Dominique Hervé AU - Aurélien Vriet AU - Juan Barbero AU - Juan Moreno AU - Alexandru Nedelcu AU - Samuel Ducret AU - Olivier Saint-Pé AU - Franck Larnaudie AU - Olivier Gilard AU - Corinne Aicardi PY - 2019 JO - Electro-Optical and Infrared Systems: Technology and Applications XVI DO - 10.1117/12.2532289 UR - https://doi.org/10.1117/12.2532289 ER -
APA
Inguimbert, C., Nuns, T., Hervé, D., Vriet, A., Barbero, J., Moreno, J., Nedelcu, A., Ducret, S., Saint-Pé, O., Larnaudie, F., Gilard, O., & Aicardi, C. (2019). Radiation-induced degradation of optoelectronic sensors. Electro-Optical and Infrared Systems: Technology and Applications XVI. https://doi.org/10.1117/12.2532289
Source records
- crossref · retrieved 2026-09-25T13:20:20.285Z