Active chromatic depth from defocus for industrial inspection

Benjamin Buat, Pauline Trouvé-Peloux, Frédéric Champagnat, Guy Le Besnerais, Thierry Simon

Open source

DOI: 10.1117/12.2554514
Published: 2020-03-30
Container: Unconventional Optical Imaging II
Publisher: SPIE
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1117/12.2554514,
  title = {Active chromatic depth from defocus for industrial inspection},
  author = {Benjamin Buat and Pauline Trouvé-Peloux and Frédéric Champagnat and Guy Le Besnerais and Thierry Simon},
  year = {2020},
  journal = {Unconventional Optical Imaging II},
  doi = {10.1117/12.2554514},
  url = {https://doi.org/10.1117/12.2554514}
}

RIS

TY  - JOUR
TI  - Active chromatic depth from defocus for industrial inspection
AU  - Benjamin Buat
AU  - Pauline Trouvé-Peloux
AU  - Frédéric Champagnat
AU  - Guy Le Besnerais
AU  - Thierry Simon
PY  - 2020
JO  - Unconventional Optical Imaging II
DO  - 10.1117/12.2554514
UR  - https://doi.org/10.1117/12.2554514
ER  -

APA

Buat, B., Trouvé-Peloux, P., Champagnat, F., Besnerais, G. L., & Simon, T. (2020). Active chromatic depth from defocus for industrial inspection. Unconventional Optical Imaging II. https://doi.org/10.1117/12.2554514

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crossref · retrieved 2026-09-25T14:32:00.928Z