Linearized forward and inverse problems of the resonant ultrasound spectroscopy for the evaluation of thin surface layers

Michal Růžek, Petr Sedlák, Hanuš Seiner, Alena Kruisová, Michal Landa

Open source

DOI
10.1121/1.3500671
Published
2010-12-01
Container
The Journal of the Acoustical Society of America
Publisher
Acoustical Society of America (ASA)
Open access
unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1121/1.3500671,
  title = {Linearized forward and inverse problems of the resonant ultrasound spectroscopy for the evaluation of thin surface layers},
  author = {Michal Růžek and Petr Sedlák and Hanuš Seiner and Alena Kruisová and Michal Landa},
  year = {2010},
  journal = {The Journal of the Acoustical Society of America},
  doi = {10.1121/1.3500671},
  url = {https://doi.org/10.1121/1.3500671}
}

RIS

TY  - JOUR
TI  - Linearized forward and inverse problems of the resonant ultrasound spectroscopy for the evaluation of thin surface layers
AU  - Michal Růžek
AU  - Petr Sedlák
AU  - Hanuš Seiner
AU  - Alena Kruisová
AU  - Michal Landa
PY  - 2010
JO  - The Journal of the Acoustical Society of America
DO  - 10.1121/1.3500671
UR  - https://doi.org/10.1121/1.3500671
ER  - 

APA

Růžek, M., Sedlák, P., Seiner, H., Kruisová, A., & Landa, M. (2010). Linearized forward and inverse problems of the resonant ultrasound spectroscopy for the evaluation of thin surface layers. The Journal of the Acoustical Society of America. https://doi.org/10.1121/1.3500671

Source records