Reduction of appearance artifacts in wearable on-skin electronics.

Liu Y, Ito S, Kato T, Wang L, Zhu Y, De Mulatier S, Arao H, Suwazono S, Asano H, Zhou Y, Mitomo H, Gong H, Nomura O, Kagawa G, Watanabe N, Behfar MH, Kuroiwa Y, Tatsuma T, Sugano Y, Takahashi H, Asai M, Kang J, Matsuhisa N

Open source

DOI
10.1126/sciadv.aee6417
Published
2026 Jul 17
Container
Science advances
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1126/sciadv.aee6417,
  title = {Reduction of appearance artifacts in wearable on-skin electronics.},
  author = {Liu Y and Ito S and Kato T and Wang L and Zhu Y and De Mulatier S and Arao H and Suwazono S and Asano H and Zhou Y and Mitomo H and Gong H and Nomura O and Kagawa G and Watanabe N and Behfar MH and Kuroiwa Y and Tatsuma T and Sugano Y and Takahashi H and Asai M and Kang J and Matsuhisa N},
  year = {2026},
  journal = {Science advances},
  doi = {10.1126/sciadv.aee6417},
  url = {https://doi.org/10.1126/sciadv.aee6417}
}

RIS

TY  - JOUR
TI  - Reduction of appearance artifacts in wearable on-skin electronics.
AU  - Liu Y
AU  - Ito S
AU  - Kato T
AU  - Wang L
AU  - Zhu Y
AU  - De Mulatier S
AU  - Arao H
AU  - Suwazono S
AU  - Asano H
AU  - Zhou Y
AU  - Mitomo H
AU  - Gong H
AU  - Nomura O
AU  - Kagawa G
AU  - Watanabe N
AU  - Behfar MH
AU  - Kuroiwa Y
AU  - Tatsuma T
AU  - Sugano Y
AU  - Takahashi H
AU  - Asai M
AU  - Kang J
AU  - Matsuhisa N
PY  - 2026
JO  - Science advances
DO  - 10.1126/sciadv.aee6417
UR  - https://doi.org/10.1126/sciadv.aee6417
ER  - 

APA

Y, L., S, I., T, K., L, W., Y, Z., S, D. M., H, A., S, S., H, A., Y, Z., H, M., H, G., O, N., G, K., N, W., MH, B., Y, K., T, T., Y, S., H, T., M, A., J, K., & N, M. (2026). Reduction of appearance artifacts in wearable on-skin electronics.. Science advances. https://doi.org/10.1126/sciadv.aee6417

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