Simulation of Carrier Trapping in an Embedded Nanowire and Its Effect in the Nano-EBIC Technique

A. El Hdiy, M. Ledra

Open source

DOI: 10.1134/s106378262101005x
Published: 2021-01
Container: Semiconductors
Publisher: Pleiades Publishing Ltd
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1134/s106378262101005x,
  title = {Simulation of Carrier Trapping in an Embedded Nanowire and Its Effect in the Nano-EBIC Technique},
  author = {A. El Hdiy and M. Ledra},
  year = {2021},
  journal = {Semiconductors},
  doi = {10.1134/s106378262101005x},
  url = {https://doi.org/10.1134/s106378262101005x}
}

RIS

TY  - JOUR
TI  - Simulation of Carrier Trapping in an Embedded Nanowire and Its Effect in the Nano-EBIC Technique
AU  - A. El Hdiy
AU  - M. Ledra
PY  - 2021
JO  - Semiconductors
DO  - 10.1134/s106378262101005x
UR  - https://doi.org/10.1134/s106378262101005x
ER  -

APA

Hdiy, A. E., & Ledra, M. (2021). Simulation of Carrier Trapping in an Embedded Nanowire and Its Effect in the Nano-EBIC Technique. Semiconductors. https://doi.org/10.1134/s106378262101005x

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crossref · retrieved 2026-09-25T18:56:05.566Z