$$\alpha $$-event characterization and rejection in point-contact HPGe detectors

I. J. Arnquist, F. T. Avignone, A. S. Barabash, C. J. Barton, F. E. Bertrand, E. Blalock, B. Bos, M. Busch, M. Buuck, T. S. Caldwell, Y.-D. Chan, C. D. Christofferson, P.-H. Chu, M. L. Clark, C. Cuesta, J. A. Detwiler, A. Drobizhev, T. R. Edwards, D. W. Edwins, F. Edzards, Y. Efremenko, S. R. Elliott, T. Gilliss, G. K. Giovanetti, M. P. Green, J. Gruszko, I. S. Guinn, V. E. Guiseppe, C. R. Haufe, R. J. Hegedus, R. Henning, D. Hervas Aguilar, E. W. Hoppe, A. Hostiuc, I. Kim, R. T. Kouzes, A. M. Lopez, J. M. López-Castaño, E. L. Martin, R. D. Martin, R. Massarczyk, S. J. Meijer, S. Mertens, J. Myslik, T. K. Oli, G. Othman, W. Pettus, A. W. P. Poon, D. C. Radford, J. Rager, A. L. Reine, K. Rielage, N. W. Ruof, B. Saykı, S. Schönert, M. J. Stortini, D. Tedeschi, R. L. Varner, S. Vasilyev, J. F. Wilkerson, M. Willers, C. Wiseman, W. Xu, C.-H. Yu, B. X. Zhu

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DOI: 10.1140/epjc/s10052-022-10161-y
Published: 2022-03
Container: The European Physical Journal C
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1140/epjc/s10052-022-10161-y,
  title = {\$\$\textbackslash{}alpha \$\$-event characterization and rejection in point-contact HPGe detectors},
  author = {I. J. Arnquist and F. T. Avignone and A. S. Barabash and C. J. Barton and F. E. Bertrand and E. Blalock and B. Bos and M. Busch and M. Buuck and T. S. Caldwell and Y.-D. Chan and C. D. Christofferson and P.-H. Chu and M. L. Clark and C. Cuesta and J. A. Detwiler and A. Drobizhev and T. R. Edwards and D. W. Edwins and F. Edzards and Y. Efremenko and S. R. Elliott and T. Gilliss and G. K. Giovanetti and M. P. Green and J. Gruszko and I. S. Guinn and V. E. Guiseppe and C. R. Haufe and R. J. Hegedus and R. Henning and D. Hervas Aguilar and E. W. Hoppe and A. Hostiuc and I. Kim and R. T. Kouzes and A. M. Lopez and J. M. López-Castaño and E. L. Martin and R. D. Martin and R. Massarczyk and S. J. Meijer and S. Mertens and J. Myslik and T. K. Oli and G. Othman and W. Pettus and A. W. P. Poon and D. C. Radford and J. Rager and A. L. Reine and K. Rielage and N. W. Ruof and B. Saykı and S. Schönert and M. J. Stortini and D. Tedeschi and R. L. Varner and S. Vasilyev and J. F. Wilkerson and M. Willers and C. Wiseman and W. Xu and C.-H. Yu and B. X. Zhu},
  year = {2022},
  journal = {The European Physical Journal C},
  doi = {10.1140/epjc/s10052-022-10161-y},
  url = {https://doi.org/10.1140/epjc/s10052-022-10161-y}
}

RIS

TY  - JOUR
TI  - $$\alpha $$-event characterization and rejection in point-contact HPGe detectors
AU  - I. J. Arnquist
AU  - F. T. Avignone
AU  - A. S. Barabash
AU  - C. J. Barton
AU  - F. E. Bertrand
AU  - E. Blalock
AU  - B. Bos
AU  - M. Busch
AU  - M. Buuck
AU  - T. S. Caldwell
AU  - Y.-D. Chan
AU  - C. D. Christofferson
AU  - P.-H. Chu
AU  - M. L. Clark
AU  - C. Cuesta
AU  - J. A. Detwiler
AU  - A. Drobizhev
AU  - T. R. Edwards
AU  - D. W. Edwins
AU  - F. Edzards
AU  - Y. Efremenko
AU  - S. R. Elliott
AU  - T. Gilliss
AU  - G. K. Giovanetti
AU  - M. P. Green
AU  - J. Gruszko
AU  - I. S. Guinn
AU  - V. E. Guiseppe
AU  - C. R. Haufe
AU  - R. J. Hegedus
AU  - R. Henning
AU  - D. Hervas Aguilar
AU  - E. W. Hoppe
AU  - A. Hostiuc
AU  - I. Kim
AU  - R. T. Kouzes
AU  - A. M. Lopez
AU  - J. M. López-Castaño
AU  - E. L. Martin
AU  - R. D. Martin
AU  - R. Massarczyk
AU  - S. J. Meijer
AU  - S. Mertens
AU  - J. Myslik
AU  - T. K. Oli
AU  - G. Othman
AU  - W. Pettus
AU  - A. W. P. Poon
AU  - D. C. Radford
AU  - J. Rager
AU  - A. L. Reine
AU  - K. Rielage
AU  - N. W. Ruof
AU  - B. Saykı
AU  - S. Schönert
AU  - M. J. Stortini
AU  - D. Tedeschi
AU  - R. L. Varner
AU  - S. Vasilyev
AU  - J. F. Wilkerson
AU  - M. Willers
AU  - C. Wiseman
AU  - W. Xu
AU  - C.-H. Yu
AU  - B. X. Zhu
PY  - 2022
JO  - The European Physical Journal C
DO  - 10.1140/epjc/s10052-022-10161-y
UR  - https://doi.org/10.1140/epjc/s10052-022-10161-y
ER  -

APA

Arnquist, I. J., Avignone, F. T., Barabash, A. S., Barton, C. J., Bertrand, F. E., Blalock, E., Bos, B., Busch, M., Buuck, M., Caldwell, T. S., Chan, Y., Christofferson, C. D., Chu, P., Clark, M. L., Cuesta, C., Detwiler, J. A., Drobizhev, A., Edwards, T. R., Edwins, D. W., Edzards, F., Efremenko, Y., Elliott, S. R., Gilliss, T., Giovanetti, G. K., Green, M. P., Gruszko, J., Guinn, I. S., Guiseppe, V. E., Haufe, C. R., Hegedus, R. J., Henning, R., Aguilar, D. H., Hoppe, E. W., Hostiuc, A., Kim, I., Kouzes, R. T., Lopez, A. M., López-Castaño, J. M., Martin, E. L., Martin, R. D., Massarczyk, R., Meijer, S. J., Mertens, S., Myslik, J., Oli, T. K., Othman, G., Pettus, W., Poon, A. W. P., Radford, D. C., Rager, J., Reine, A. L., Rielage, K., Ruof, N. W., Saykı, B., Schönert, S., Stortini, M. J., Tedeschi, D., Varner, R. L., Vasilyev, S., Wilkerson, J. F., Willers, M., Wiseman, C., Xu, W., Yu, C., & Zhu, B. X. (2022). $$\alpha $$-event characterization and rejection in point-contact HPGe detectors. The European Physical Journal C. https://doi.org/10.1140/epjc/s10052-022-10161-y

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