INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER

P. Fouillat, V. Pouget, D. Lewis, S. Buchner, D. McMorrow

Open source

DOI: 10.1142/s0129156404002387
Published: 2004-06
Container: International Journal of High Speed Electronics and Systems
Publisher: World Scientific Pub Co Pte Lt
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1142/s0129156404002387,
  title = {INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER},
  author = {P. Fouillat and V. Pouget and D. Lewis and S. Buchner and D. McMorrow},
  year = {2004},
  journal = {International Journal of High Speed Electronics and Systems},
  doi = {10.1142/s0129156404002387},
  url = {https://doi.org/10.1142/s0129156404002387}
}

RIS

TY  - JOUR
TI  - INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER
AU  - P. Fouillat
AU  - V. Pouget
AU  - D. Lewis
AU  - S. Buchner
AU  - D. McMorrow
PY  - 2004
JO  - International Journal of High Speed Electronics and Systems
DO  - 10.1142/s0129156404002387
UR  - https://doi.org/10.1142/s0129156404002387
ER  -

APA

Fouillat, P., Pouget, V., Lewis, D., Buchner, S., & McMorrow, D. (2004). INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER. International Journal of High Speed Electronics and Systems. https://doi.org/10.1142/s0129156404002387

Source records

crossref · retrieved 2026-11-05T21:47:04.639Z