Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits
- DOI
- 10.1142/s0218126616400144
- Published
- 2015-12-28
- Container
- Journal of Circuits, Systems and Computers
- Publisher
- World Scientific Pub Co Pte Lt
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1142/s0218126616400144,
title = {Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits},
author = {Florence Azaïs and Stéphane David-Grignot and Laurent Latorre and François Lefevre},
year = {2015},
journal = {Journal of Circuits, Systems and Computers},
doi = {10.1142/s0218126616400144},
url = {https://doi.org/10.1142/s0218126616400144}
}RIS
TY - JOUR TI - Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits AU - Florence Azaïs AU - Stéphane David-Grignot AU - Laurent Latorre AU - François Lefevre PY - 2015 JO - Journal of Circuits, Systems and Computers DO - 10.1142/s0218126616400144 UR - https://doi.org/10.1142/s0218126616400144 ER -
APA
Azaïs, F., David-Grignot, S., Latorre, L., & Lefevre, F. (2015). Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. Journal of Circuits, Systems and Computers. https://doi.org/10.1142/s0218126616400144
Source records
- crossref · retrieved 2026-11-10T18:59:38.067Z