Asynchronous circuits transient faults sensitivity evaluation

Y. Monnet, M. Renaudin, R. Leveugle

Open source

DOI: 10.1145/1065579.1065805
Published: 2005
Container: Proceedings of the 42nd annual conference on Design automation - DAC '05
Publisher: ACM Press
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1145/1065579.1065805,
  title = {Asynchronous circuits transient faults sensitivity evaluation},
  author = {Y. Monnet and M. Renaudin and R. Leveugle},
  year = {2005},
  journal = {Proceedings of the 42nd annual conference on Design automation  - DAC '05},
  doi = {10.1145/1065579.1065805},
  url = {https://doi.org/10.1145/1065579.1065805}
}

RIS

TY  - JOUR
TI  - Asynchronous circuits transient faults sensitivity evaluation
AU  - Y. Monnet
AU  - M. Renaudin
AU  - R. Leveugle
PY  - 2005
JO  - Proceedings of the 42nd annual conference on Design automation  - DAC '05
DO  - 10.1145/1065579.1065805
UR  - https://doi.org/10.1145/1065579.1065805
ER  -

APA

Monnet, Y., Renaudin, M., & Leveugle, R. (2005). Asynchronous circuits transient faults sensitivity evaluation. Proceedings of the 42nd annual conference on Design automation - DAC '05. https://doi.org/10.1145/1065579.1065805

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crossref · retrieved 2026-11-10T11:06:16.164Z