Evolutionary failing-test generation for modern microprocessors

Ernesto Sanchez, Giovanni Squillero, Alberto Tonda

DOI: 10.1145/2001858.2001985
Published: 2011
Container: Not recorded
Publisher: ACM - Association for Computing Machinery
Open access: no

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Cite this work

BibTeX

@article{allodium:10.1145/2001858.2001985,
  title = {Evolutionary failing-test generation for modern microprocessors},
  author = {Ernesto Sanchez and Giovanni Squillero and Alberto Tonda},
  year = {2011},
  doi = {10.1145/2001858.2001985},
  url = {https://doi.org/10.1145/2001858.2001985}
}

RIS

TY  - JOUR
TI  - Evolutionary failing-test generation for modern microprocessors
AU  - Ernesto Sanchez
AU  - Giovanni Squillero
AU  - Alberto Tonda
PY  - 2011
DO  - 10.1145/2001858.2001985
UR  - https://doi.org/10.1145/2001858.2001985
ER  -

APA

Sanchez, E., Squillero, G., & Tonda, A. (2011). Evolutionary failing-test generation for modern microprocessors. https://doi.org/10.1145/2001858.2001985

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hal · retrieved 2026-09-25T14:34:06.239Z