A new approach to detect potential race conditions in component-based systems

Jean-Yves Didier, Malik Mallem

Open source

DOI
10.1145/2602458.2602470
Published
2014-06-27
Container
Proceedings of the 17th international ACM Sigsoft symposium on Component-based software engineering
Publisher
ACM
Open access
unknown

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BibTeX

@article{allodium:10.1145/2602458.2602470,
  title = {A new approach to detect potential race conditions in component-based systems},
  author = {Jean-Yves Didier and Malik Mallem},
  year = {2014},
  journal = {Proceedings of the 17th international ACM Sigsoft symposium on Component-based software engineering},
  doi = {10.1145/2602458.2602470},
  url = {https://doi.org/10.1145/2602458.2602470}
}

RIS

TY  - JOUR
TI  - A new approach to detect potential race conditions in component-based systems
AU  - Jean-Yves Didier
AU  - Malik Mallem
PY  - 2014
JO  - Proceedings of the 17th international ACM Sigsoft symposium on Component-based software engineering
DO  - 10.1145/2602458.2602470
UR  - https://doi.org/10.1145/2602458.2602470
ER  - 

APA

Didier, J., & Mallem, M. (2014). A new approach to detect potential race conditions in component-based systems. Proceedings of the 17th international ACM Sigsoft symposium on Component-based software engineering. https://doi.org/10.1145/2602458.2602470

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