The Microstructures and Electrical Resistivity of (Al, Cr, Ti)FeCoNiO<sub><i>x</i></sub>High-Entropy Alloy Oxide Thin Films
- DOI
- 10.1155/2015/353140
- Published
- 2015
- Container
- Advances in Materials Science and Engineering
- Publisher
- Wiley
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1155/2015/353140,
title = {The Microstructures and Electrical Resistivity of (Al, Cr, Ti)FeCoNiO<sub><i>x</i></sub>High-Entropy Alloy Oxide Thin Films},
author = {Chun-Huei Tsau and Zhang-Yan Hwang and Swe-Kai Chen},
year = {2015},
journal = {Advances in Materials Science and Engineering},
doi = {10.1155/2015/353140},
url = {https://doi.org/10.1155/2015/353140}
}RIS
TY - JOUR TI - The Microstructures and Electrical Resistivity of (Al, Cr, Ti)FeCoNiO<sub><i>x</i></sub>High-Entropy Alloy Oxide Thin Films AU - Chun-Huei Tsau AU - Zhang-Yan Hwang AU - Swe-Kai Chen PY - 2015 JO - Advances in Materials Science and Engineering DO - 10.1155/2015/353140 UR - https://doi.org/10.1155/2015/353140 ER -
APA
Tsau, C., Hwang, Z., & Chen, S. (2015). The Microstructures and Electrical Resistivity of (Al, Cr, Ti)FeCoNiO<sub><i>x</i></sub>High-Entropy Alloy Oxide Thin Films. Advances in Materials Science and Engineering. https://doi.org/10.1155/2015/353140
Source records
- crossref · retrieved 2026-11-06T00:25:58.725Z