Free-Electron Screening Mechanism of the Shallow Impurity Breakdown in n-GaAs: Evidences from the Photoelectric Zeeman and Cyclotron Resonance Spectroscopies

O. Z. Alekperov, E. P. Nakhmedov

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DOI: 10.1155/2019/1915320
Published: 2019-05-30
Container: Journal of Spectroscopy
Publisher: Wiley
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1155/2019/1915320,
  title = {Free-Electron Screening Mechanism of the Shallow Impurity Breakdown in n-GaAs: Evidences from the Photoelectric Zeeman and Cyclotron Resonance Spectroscopies},
  author = {O. Z. Alekperov and E. P. Nakhmedov},
  year = {2019},
  journal = {Journal of Spectroscopy},
  doi = {10.1155/2019/1915320},
  url = {https://doi.org/10.1155/2019/1915320}
}

RIS

TY  - JOUR
TI  - Free-Electron Screening Mechanism of the Shallow Impurity Breakdown in n-GaAs: Evidences from the Photoelectric Zeeman and Cyclotron Resonance Spectroscopies
AU  - O. Z. Alekperov
AU  - E. P. Nakhmedov
PY  - 2019
JO  - Journal of Spectroscopy
DO  - 10.1155/2019/1915320
UR  - https://doi.org/10.1155/2019/1915320
ER  -

APA

Alekperov, O. Z., & Nakhmedov, E. P. (2019). Free-Electron Screening Mechanism of the Shallow Impurity Breakdown in n-GaAs: Evidences from the Photoelectric Zeeman and Cyclotron Resonance Spectroscopies. Journal of Spectroscopy. https://doi.org/10.1155/2019/1915320

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crossref · retrieved 2026-11-10T09:56:53.223Z