Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy

Eisaku Oho, Kazuhiko Suzuki, Sadao Yamazaki

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DOI: 10.1155/2020/4979431
Published: 2020-03-31
Container: Scanning
Publisher: Wiley
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1155/2020/4979431,
  title = {Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy},
  author = {Eisaku Oho and Kazuhiko Suzuki and Sadao Yamazaki},
  year = {2020},
  journal = {Scanning},
  doi = {10.1155/2020/4979431},
  url = {https://doi.org/10.1155/2020/4979431}
}

RIS

TY  - JOUR
TI  - Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy
AU  - Eisaku Oho
AU  - Kazuhiko Suzuki
AU  - Sadao Yamazaki
PY  - 2020
JO  - Scanning
DO  - 10.1155/2020/4979431
UR  - https://doi.org/10.1155/2020/4979431
ER  -

APA

Oho, E., Suzuki, K., & Yamazaki, S. (2020). Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy. Scanning. https://doi.org/10.1155/2020/4979431

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crossref · retrieved 2026-09-26T22:30:57.751Z